Opinia o kondycji dysku


(saturno) #1

Witam.

Mam zamiar kupić używany dysk Seagate Barracuda ST360014A i przed zakupem chciałbym wiedzieć jaka jest kondycja tego dysku.

Na dysku nie ma obecnie żadnego systemu i w związku z tym znalazłem program którym można odczytać SMART.

Załączam zrzuty oraz raport z programu i proszę o napisanie opinii o tym dysku:

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smartctl 5.39 2009-12-09 r2995 [i486-slackware-linux-gnu] (local build)

Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===

Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus family

Device Model: ST360014A

Serial Number: 3JV1629K

Firmware Version: 3.04

User Capacity: 60,022,480,896 bytes

Device is: In smartctl database [for details use: -P show]

ATA Version is: 6

ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2

Local Time is: Sat Apr 17 12:17:16 2010 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED


General SMART Values:

Offline data collection status: (0x82)	Offline data collection activity

					was completed without error.

					Auto Offline Data Collection: Enabled.

Self-test execution status: ( 0)	The previous self-test routine completed

					without error or no self-test has ever 

					been run.

Total time to complete Offline 

data collection: ( 430) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

					Auto Offline data collection on/off support.

					Suspend Offline collection upon new

					command.

					Offline surface scan supported.

					Self-test supported.

					No Conveyance Self-test supported.

					Selective Self-test supported.

SMART capabilities: (0x0003)	Saves SMART data before entering

					power-saving mode.

					Supports SMART auto save timer.

Error logging capability: (0x01)	Error logging supported.

					No General Purpose Logging support.

Short self-test routine 

recommended polling time: ( 1) minutes.

Extended self-test routine

recommended polling time: ( 58) minutes.


SMART Attributes Data Structure revision number: 10

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

  1 Raw_Read_Error_Rate 0x000f 059 051 006 Pre-fail Always - 101254673

  3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0

  4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 4000

  5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 6

  7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 390659479

  9 Power_On_Hours 0x0032 090 090 000 Old_age Always - 9253

 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0

 12 Power_Cycle_Count 0x0032 094 094 020 Old_age Always - 6319

194 Temperature_Celsius 0x0022 041 054 000 Old_age Always - 41

195 Hardware_ECC_Recovered 0x001a 059 051 000 Old_age Always - 101254673

197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0

198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0

199 UDMA_CRC_Error_Count 0x003e 200 187 000 Old_age Always - 13

200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0

202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0


SMART Error Log Version: 1

ATA Error Count: 448 (device log contains only the most recent five errors)

	CR = Command Register [HEX]

	FR = Features Register [HEX]

	SC = Sector Count Register [HEX]

	SN = Sector Number Register [HEX]

	CL = Cylinder Low Register [HEX]

	CH = Cylinder High Register [HEX]

	DH = Device/Head Register [HEX]

	DC = Device Command Register [HEX]

	ER = Error register [HEX]

	ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.


Error 448 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)

  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:

  ER ST SC SN CL CH DH

  -- -- -- -- -- -- --

  84 51 01 00 00 00 f0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0


  Commands leading to the command that caused the error were:

  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

  -- -- -- -- -- -- -- -- ---------------- --------------------

  c8 00 01 00 00 00 f0 00 00:05:27.332 READ DMA

  c8 00 01 00 00 00 f0 00 00:05:27.321 READ DMA

  c8 00 01 00 00 00 f0 00 00:05:26.721 READ DMA

  c8 00 01 6e 28 65 f4 00 00:05:26.705 READ DMA

  c8 00 01 f8 11 f4 f1 00 00:05:26.705 READ DMA


Error 447 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)

  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:

  ER ST SC SN CL CH DH

  -- -- -- -- -- -- --

  84 51 01 f8 11 f4 f1 Error: ICRC, ABRT 1 sectors at LBA = 0x01f411f8 = 32772600


  Commands leading to the command that caused the error were:

  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

  -- -- -- -- -- -- -- -- ---------------- --------------------

  c8 00 01 f8 11 f4 f1 00 00:04:18.426 READ DMA

  c8 00 01 f8 11 f4 f1 00 00:04:18.412 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:17.705 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:17.694 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:16.044 READ DMA


Error 446 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)

  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:

  ER ST SC SN CL CH DH

  -- -- -- -- -- -- --

  84 51 01 f8 11 f4 f1 Error: ICRC, ABRT 1 sectors at LBA = 0x01f411f8 = 32772600


  Commands leading to the command that caused the error were:

  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

  -- -- -- -- -- -- -- -- ---------------- --------------------

  c8 00 01 f8 11 f4 f1 00 00:04:18.426 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:18.412 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:17.705 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:17.694 READ DMA

  c8 00 01 6e 28 65 f4 00 00:04:16.044 READ DMA


Error 445 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)

  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:

  ER ST SC SN CL CH DH

  -- -- -- -- -- -- --

  84 51 01 f8 11 f4 f1 Error: ICRC, ABRT 1 sectors at LBA = 0x01f411f8 = 32772600


  Commands leading to the command that caused the error were:

  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

  -- -- -- -- -- -- -- -- ---------------- --------------------

  c8 00 01 f8 11 f4 f1 00 00:04:14.713 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:14.713 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:14.698 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:13.992 READ DMA

  c8 00 01 6e 28 65 f4 00 00:04:16.044 READ DMA


Error 444 occurred at disk power-on lifetime: 9249 hours (385 days + 9 hours)

  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:

  ER ST SC SN CL CH DH

  -- -- -- -- -- -- --

  84 51 01 00 00 00 f0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0


  Commands leading to the command that caused the error were:

  CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

  -- -- -- -- -- -- -- -- ---------------- --------------------

  c8 00 01 00 00 00 f0 00 00:04:10.197 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:10.196 READ DMA

  c8 00 01 6e 28 65 f4 00 00:04:10.195 READ DMA

  c8 00 01 f8 11 f4 f1 00 00:04:10.177 READ DMA

  c8 00 01 00 00 00 f0 00 00:04:09.143 READ DMA


SMART Self-test log structure revision number 1

Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error

# 1 Extended offline Completed without error 00% 9253 -

# 2 Short offline Completed without error 00% 9253 -

# 3 Short offline Completed without error 00% 9252 -

# 4 Short offline Completed without error 00% 2290 -


SMART Selective self-test log data structure revision number 1

 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

    1 0 0 Not_testing

    2 0 0 Not_testing

    3 0 0 Not_testing

    4 0 0 Not_testing

    5 0 0 Not_testing

Selective self-test flags (0x0):

  After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

(Michal Kolatek) #2

On się nie nadaje na sprzedaż, tylko na szrot. Ma badsectory, to tak jak by był uszkodzony fizycznie, możliwe że w ogóle nie zainstalujesz na nim systemu, a paść może w każdej chwili.