Temat wiem że nie do końca pasuje do działu, ale myślę że tutaj prędzej się ktoś trafi kto potrafi przeanalizować log z smartctl. Jest to dysk z laptopa który został zalany, tutaj log:
smartctl 6.3 2014-07-26 r3976 [x86_64-linux-3.19.3-3-ARCH] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint M8 (AF)
Device Model: SAMSUNG HN-M500MBB
Serial Number: S2RSJ9CBB26181
LU WWN Device Id: 5 0024e9 20677504e
Firmware Version: 2AR10001
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Apr 24 11:37:07 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 137) The previous self-test completed having
a test element that failed and the
device is suspected of having handling
damage.
Total time to complete Offline
data collection: ( 6840) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 114) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 001 001 051 Pre-fail Always FAILING_NOW 37783
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 091 086 025 Pre-fail Always - 2867
4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 3449
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 3243
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 099 099 000 Old_age Always - 1903
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 3266
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 3061
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 064 040 000 Old_age Always - 26 (Min/Max 11/61)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 2002
223 Load_Retry_Count 0x0032 099 099 000 Old_age Always - 1903
225 Load_Cycle_Count 0x0032 098 098 000 Old_age Always - 22502
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 3165 hours (131 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 39 c0 ea 26 e0 Error: ICRC, ABRT 57 sectors at LBA = 0x0026eac0 = 2550464
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 7f 7a ea 26 e0 00 00:00:00.046 READ DMA
c8 00 7f 7a ea 26 e0 00 00:00:00.046 READ DMA
c8 00 01 fd f8 26 e0 00 00:00:00.046 READ DMA
c8 00 0d f0 f8 26 e0 00 00:00:00.046 READ DMA
c8 00 02 78 ea 26 e0 00 00:00:00.046 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: handling damage?? 90% 3243 0
# 2 Short offline Completed: handling damage?? 90% 3243 0
# 3 Extended offline Completed: handling damage?? 90% 3243 0
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed_handling_damage?? [90% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Co ciekawe nie ma żadnego Reallocated_Sector_Ct co by wynikało że sam talerzy dysku są sprawne, czy jest sens próbować wyzerować ten dysk?