Windows 8.1 działa bardzo wolno, wina dysku?


(roczek) #1

Witam.
Od jakiegoś czasu mam problem z systemem windows 8.1 na laptopie.
Wszystko chodzi bardzo wolno. Pliki otwierają się bardzo długo, np na uruchomienie FF muszę czekać kilka minut. Przeskanowałem system programem antywirusowym i nic nie wykrył. Wymontowałem dysk podłączyłem pod 2-gi komputer i przeprowadziłem diagnostykę.

sudo smartctl --all /dev/sdc
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.13.0-1-amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Hitachi/HGST Travelstar Z5K500
Device Model:     Hitachi HTS545050A7E380
Serial Number:    120817TE85123RJJG1HW
LU WWN Device Id: 5 000cca 6f7e3a9ae
Firmware Version: GG2OA7A0
User Capacity:    500,107,862,016 bytes [500 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS T13/1699-D revision 6
SATA Version is:  SATA 2.6, 3.0 Gb/s
Local Time is:    Sat Oct 21 07:25:02 2017 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 117)	The previous self-test completed having
					the read element of the test failed.
Total time to complete Offline 
data collection: 		(   45) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 112) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   062    Pre-fail  Always       -       65536
  2 Throughput_Performance  0x0005   100   100   040    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0007   214   214   033    Pre-fail  Always       -       1
  4 Start_Stop_Count        0x0012   097   097   000    Old_age   Always       -       5337
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       1
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   040    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0012   089   089   000    Old_age   Always       -       4991
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   097   097   000    Old_age   Always       -       5151
191 G-Sense_Error_Rate      0x000a   100   100   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   099   099   000    Old_age   Always       -       265
193 Load_Cycle_Count        0x0012   078   078   000    Old_age   Always       -       229958
194 Temperature_Celsius     0x0002   240   240   000    Old_age   Always       -       25 (Min/Max 11/46)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       1
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       8
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0
223 Load_Retry_Count        0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 22 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 22 occurred at disk power-on lifetime: 4981 hours (207 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 70 5b f4 0b  Error: UNC 8 sectors at LBA = 0x0bf45b70 = 200563568

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 70 5b f4 e0 00      01:55:49.447  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:49.446  SET FEATURES [Set transfer mode]
  25 00 08 70 5b f4 0b 04      01:55:49.416  READ DMA EXT
  25 00 08 70 5b f4 e0 00      01:55:46.002  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:46.001  SET FEATURES [Set transfer mode]

Error 21 occurred at disk power-on lifetime: 4981 hours (207 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 70 5b f4 0b  Error: UNC 8 sectors at LBA = 0x0bf45b70 = 200563568

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 70 5b f4 e0 00      01:55:46.002  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:46.001  SET FEATURES [Set transfer mode]
  25 00 08 70 5b f4 0b 04      01:55:45.972  READ DMA EXT
  25 00 08 70 5b f4 e0 00      01:55:42.558  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:42.557  SET FEATURES [Set transfer mode]

Error 20 occurred at disk power-on lifetime: 4981 hours (207 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 70 5b f4 0b  Error: UNC 8 sectors at LBA = 0x0bf45b70 = 200563568

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 70 5b f4 e0 00      01:55:42.558  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:42.557  SET FEATURES [Set transfer mode]
  25 00 08 70 5b f4 0b 04      01:55:42.527  READ DMA EXT
  25 00 08 70 5b f4 e0 00      01:55:39.122  READ DMA EXT
  25 00 08 68 5b f4 e0 00      01:55:39.115  READ DMA EXT

Error 19 occurred at disk power-on lifetime: 4981 hours (207 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 70 5b f4 0b  Error: UNC 8 sectors at LBA = 0x0bf45b70 = 200563568

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 70 5b f4 e0 00      01:55:39.122  READ DMA EXT
  25 00 08 68 5b f4 e0 00      01:55:39.115  READ DMA EXT
  25 00 10 d8 5c f4 e0 00      01:55:39.115  READ DMA EXT
  25 00 f0 e8 5b f4 e0 00      01:55:39.080  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:39.079  SET FEATURES [Set transfer mode]

Error 18 occurred at disk power-on lifetime: 4981 hours (207 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 78 70 5b f4 0b  Error: UNC 120 sectors at LBA = 0x0bf45b70 = 200563568

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 80 68 5b f4 e0 00      01:55:35.645  READ DMA EXT
  25 00 40 28 5b f4 e0 00      01:55:35.644  READ DMA EXT
  25 00 20 08 5b f4 e0 00      01:55:35.644  READ DMA EXT
  25 00 08 00 5b f4 e0 00      01:55:35.624  READ DMA EXT
  ef 03 46 00 00 00 a0 00      01:55:35.623  SET FEATURES [Set transfer mode]

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed: read failure       50%      4984         468999024
# 2  Short offline       Completed without error       00%      4983         -
# 3  Short offline       Interrupted (host reset)      90%      4983         -
# 4  Extended offline    Aborted by host               90%      4980         -
# 5  Short offline       Completed without error       00%      4976         -
# 6  Short offline       Completed without error       00%      4976         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay. 

sudo badblocks -v -s /dev/sdc > badblocks.log 
Checking blocks 0 to 488386583
Checking for bad blocks (read-only test): done                                                 
Pass completed, 4 bad blocks found. (4/0/0 errors)

Czy ktoś może ocenić kondycję tego dysku ?


(SlawekB44) #2

Dysk remapował sektor, oraz w kolejce mogą czekać następne. Raczej na system się nie nadaje, może być na mniej istotne dane, jako dysk zewnętrzny. Po skopiowaniu danych i systemu należy wykonać zerowanie(MHDD, HDAT2, Vivard - pod DOS, Victoria, DMDE - winPE)